Surface Scratch Imaging" Array-Compatible Compact Eddy Current Flaw Detector "μS₂G₂
Surface scratch imaging is now possible! Anyone can easily and quickly perform C-scan flaw detection! Inspection results are stored as digital data.
The array-compatible compact eddy current flaw detector "μS2G2" allows anyone to easily and quickly perform C-scan inspections, enabling the visualization of defects that were previously impossible to detect. 【Features】 The device is compact and lightweight (under 2 kg). By holding a tablet in one hand and a probe in the other, inspections can be conducted by a single operator. The tablet and device are connected via Wi-Fi. Power is supplied by a battery, and the only cables are between the device and the probe, making the operation very simple. - Rugged housing design: The device is dustproof and waterproof, and has passed a 1-meter drop test. - Customization Probes and devices can be customized to meet specific requirements. Custom support is available. - Board (circuit board) supply Boards can be provided. They can be utilized as OEMs or integrated into crawlers and robots.
- Company：ディービー 本社、東京
- Price：Other
